The California NanoSystems Institute (CNSI) at UCLA (University of California, Los Angeles) - one of the major nanotechnology institutes in the United States - was the host of a two-day, AFM-Raman and TERS workshop given by Nanonics Imaging Ltd. and Renishaw, market leaders in AFM-Raman systems.
The workshop wasground-breaking in its demonstration of Tip Enhanced RamanSpectroscopy (TERS), using a combination of the Nanonics' MultiViewsystem and the Renishaw inVia Raman microscope.
Nanonics andRenishaw were introduced as "the only companies willing to come anddemonstrate TERS" by Dr. Adam Stieg, Scientific Director of theNano and Pico Characterization Facility of CNSI. The TERSdemonstration was carried out using reflection mode TERS on anopaque sample of silicon with a thin 15nm layer of strained Si(sSi) on top. The criticality of the positioning of the TERS probein contact with the sSi thin layer was demonstrated, and the cleardifference between contact and out-of-contact of the sSi Raman peakwas clearly seen by all.
In addition, theworkshop consisted of an exciting lecture by Nanonics CEO andFounder, Prof. Aaron Lewis on the subject: Integrated Online AFM& Raman, Synergistic Chemically Correlated Structural Tool withUltimate Nanometric Resolution.
The workshop andlecture were met with great success and positive feedback from theparticipants. Among the attendees were on-campus users of the Nanoand Pico Characterization Facility and off-campus interestedparticipants, such as conservation scientists of the world-renownedJ. Paul Getty Museum in Malibu California.
(From the CNSIwebsite): The California NanoSystems Institute (CNSI) is a researchcenter at UCLA whose mission is to encourage universitycollaboration with industry and to enable the rapidcommercialization of discoveries in nanosystems. CNSI members whoare on the faculty at UCLA represent a multi-disciplinary team ofsome of the world's preeminent scientists. The work conducted atthe CNSI represents world-class expertise in four targeted areas ofnanosystems-related research including Energy, Environment,Health-Medicine, and Information Technology.
Nanonics Imagingis the premier innovator of AFM and NSOM systems in the SPM market and the pioneer in the field since its inception in 1997. Since the founding of Nanonics fifteen years ago, it has introduced to the SPM market novel directions in the introduction of SPM technology to new horizons in fundamental and applied research. From its revolutionary approach to NSOM imaging with cantilievered NSOM fiber probes, to online tip and sample scanning AFM systems and its introduction of multiprobe AFM systems, Nanonics has led the way in the next evolution of SPM. These systems are the premier measurement tools in all photonics applications and in Raman-AFM and NSOM systems, both at room temperature and in cryogenic environments. Complimenting this portfolio of widely-applicable products are the singular solutions that Nanonics provides for AFM, SEM and FIB integration with its NanoToolKitTM of ion/electron beam- and multiprobe-friendly SPM tips for optical, electrical, thermal and nanolithography.